X-ray imaging apparatus, x-ray imaging method, and x-ray imaging program

ABSTRACT

An X-ray imaging apparatus includes a phase grating, an absorption grating, a detector, and an arithmetic unit. The arithmetic unit executes a Fourier transform step of performing Fourier transform for an intensity distribution of a Moiré acquired by the detector, and acquiring a spatial frequency spectrum. Also, the arithmetic unit executes a phase retrieval step of separating a spectrum corresponding to a carrier frequency from a spatial frequency spectrum acquired in the Fourier transform step, performing inverse Fourier transform for the separated spectrum, and acquiring a differential phase image.

This application is a Continuation of prior U.S. patent application Ser.No. 12/842,937 filed Jul. 23, 2010, which is a Continuation ofInternational Application No. PCT/JP2009/068434, filed Oct. 27, 2009,which claims the benefit of Japanese Patent Application No. 2008-278425,filed Oct. 29, 2008. The disclosures of the above-named applications arehereby incorporated by reference herein in their entirety.

TECHNICAL FIELD

The present invention relates to an X-ray imaging apparatus, an X-rayimaging method, and an X-ray imaging program.

BACKGROUND ART

Since X-rays have high substance transmittivity and can perform imagingwith high spatial resolution, for example, X-rays are used fornondestructive inspection of subjects in industrial use, and forradiography in medical use. In these cases, a contrast image is formedby using a difference of X-ray absorption coefficient for substances, orliving bodies when x-ray transmits through the substances or livingbodies, depending on constituent elements or due to a difference indensities of the substances or living bodies. Such an imaging method iscalled X-ray absorption contrast method. However, a light elementabsorbs X-ray by a very small amount. It is difficult to image livingsoft tissues made of carbon, hydrogen, oxygen, etc., which areconstituent elements of a living body, or soft materials by the X-rayabsorption contrast method.

On the contrary to this, as a method for clearly imaging even tissuesmade of light elements, X-ray phase-contrast methods using a phasedifference of X-rays have been studied since the nineteen-nineties.

A large number of X-ray phase-contrast methods have been developed. Oneof such methods may be an X-ray phase-contrast method using Talbotinterference as a method capable of using a conventional X-ray tube(Patent literature 1).

The method using the Talbot interference described in Patent literature1 includes an X-ray tube that generates X-rays, a phase grating thatmodulates the phase of the X-rays and generates an interferenceintensity distribution, an absorption grating that converts theinterference intensity distribution into an intensity distribution of aMoiré, and an X-ray detector that detects the interference intensitydistribution.

In the method described in Patent literature 1, imaging is performed byscanning the absorption grating along the direction of the gratingperiod. With this scanning, the Moiré to be detected is moved. When thescanning length reaches one period of the absorption grating, the imageof the Moiré is retrieved to the original state. Arithmetic processingis performed using at least three images of image data during scanning,and thus a differential phase image is acquired.

The method described in Patent literature 1 acquires a differentialphase image by performing imaging for at least three images, andcalculates a phase image from the differential phase image.

Since the method described in Patent literature 1 has to perform imagingfor at least three images, if a subject is moved during imaging, imagequality may be degraded.

Also, if the period of time for imaging increases, the X-ray dose for asubject increases. It is not desirable for medical use.

The present invention provides an X-ray imaging apparatus, an X-rayimaging method, and an X-ray imaging method that can acquire adifferential phase image or a phase image of a subject by at least asingle imaging operation.

CITATION LIST Patent Literature

-   PTL 1: U.S. Pat. No. 7,180,979

SUMMARY OF INVENTION

An X-ray imaging apparatus according to the present invention includesan X-ray source; a phase grating that transmits X-rays from the X-raysource and forms an interference intensity distribution by the Talboteffect; an absorption grating that partly shields the interferenceintensity distribution formed by the phase grating and generates aMoiré; a detector that detects an intensity distribution of the Moirégenerated by the absorption grating; and an arithmetic unit that imagesinformation of a subject from the intensity distribution of the Moirédetected by the detector and outputs the information. The arithmeticunit executes a process including a Fourier transform step of performingFourier transform for the intensity distribution of the Moiré acquiredby the detector and acquiring a spatial frequency spectrum, and a phaseretrieval step of separating a spectrum corresponding to a carrierfrequency from the spatial frequency spectrum acquired in the Fouriertransform step, performing inverse Fourier transform for the separatedspectrum, and acquiring a differential phase image.

Further features of the present invention will become apparent from thefollowing description of exemplary embodiments with reference to theattached drawings.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is an explanatory view of an X-ray imaging apparatus according toa first embodiment of the present invention.

FIGS. 2A and 2B are explanatory views of two-dimensional phase gratingsaccording to second and third embodiments of the present invention.

FIGS. 3A and 3B are explanatory views of two-dimensional phase gratingsaccording to the first and second embodiments of the present invention.

FIG. 4 illustrates a spectrum pattern of an interference intensitydistribution.

FIGS. 5A to 5D illustrate intensity distributions of Moiré and spectrumpatterns when the two-dimensional phase grating is used.

FIG. 6 is an explanatory view of a flowchart of an analyzing methodexecuted by an arithmetic unit according to the present invention.

FIGS. 7A and 7B are explanatory views of an intensity distribution of aMoiré and a spatial frequency spectrum according to the secondembodiment of the present invention.

FIGS. 8A and 8B are explanatory views of an intensity distribution of aMoiré and a spatial frequency spectrum according to the third embodimentof the present invention.

FIG. 9 is an explanatory view of a zoom mechanism according to a fourthembodiment of the present invention.

DESCRIPTION OF EMBODIMENTS First Embodiment

FIG. 1 illustrates an exemplary configuration of an X-ray imagingapparatus using Talbot interference. A process to acquire a phase imageby using the X-ray imaging apparatus will be described in detail.

(X-Ray Source)

X-rays 111 generated by an X-ray source 110 are transmitted through asubject 120. When the X-rays 111 are transmitted through the subject120, the phase of the X-rays 111 is changed and the X-rays 111 isabsorbed depending on the composition, shape, etc., of the subject 120.

The X-rays may be continuous X-rays or characteristic X-rays. Thewavelength of the X-rays is selected in a range from about 0.1 Å to 5 Å.A wavelength selection filter and/or a grating for a source may beprovided downstream of the X-ray source 110.

(Phase Grating)

The X-rays 111 transmitted through the subject 120 is transmittedthrough a phase grating 130. Then, the x-rays 111 form an interferenceintensity distribution 140 by the Talbot effect.

The phase grating 130 is arranged upstream or downstream of the subject120.

The phase grating 130 includes phase advance portions 131 and phase lagportions 132, which are formed by periodically changing the thickness ofan X-ray transmissive member. The phase advance portions 131 and thephase lag portions 132 may be formed such that the phase of the X-raystransmitted through the phase advance portions 131 is different from thephase of the X-rays transmitted through the phase lag portions 132. Forexample, the phase of the X-rays transmitted through the phase advanceportions 131 is advanced by it relative to the phase of the X-raystransmitted through the phase lag portions 132. The amount of change inthickness is determined by the wavelength of the X-rays to be used, andthe member.

The phase grating 130 typically modulates the phase of the X-raystransmitted through the phase advance portions 131 by π or π/2 relativeto the phase of the X-rays transmitted through the phase lag portions132. The former grating may be called π phase grating, and the latergrating may be called π/2 phase grating. The modulation amount of aphase is only required to be periodic. For example, modulation may beπ/3 modulation.

The phase grating 130 may have a one-dimensional linear shape.Alternatively, the phase grating 130 may have a two-dimensional checkerboard designed pattern as shown in FIG. 2A. Still alternatively, thephase grating 130 may have a lattice-shaped pattern as shown in FIG. 2B.Referring to FIGS. 2A and 2B, reference sign d denotes a period, 201denotes a two-dimensional phase grating, 210 denotes phase advanceportions, and 220 denotes phase lag portions.

The shape of each phase advance portion 210 or each phase lag portion220 is a square in FIGS. 2A and 2B, however, the outer edge thereof maybe deformed into a circular shape through fabrication. Even when theshape is deformed into the circular shape, the deformed portion can beused as a phase grating.

If the phase grating 130 has a one-dimensional period, phase gradientinformation only in a one-dimensional direction of the subject 120 isacquired. In contrast, if the phase grating 130 has a two-dimensionalperiod, phase gradient information in two-dimensional directions can beacquired, which is advantageous.

The material of the phase grating 130 is desirably a substance thattransmits X-rays. For example, the material may be silicon.

An interference intensity distribution formed after the X-rays aretransmitted through the phase grating 130 most clearly appears at aposition, at which, when Z₀ is a distance from the X-ray source to thephase grating 130 and Z₁ is a distance from the phase grating 130 to anabsorption grating 150, the distance Z₁ satisfies the followingExpression (1). Herein, the “interference intensity distribution” is aperiodic intensity distribution in which the grating period of the phasegrating 130 is reflected.

In Expression (1), λ is a wavelength of the X-rays and d is a gratingperiod of the phase grating 130.

$\begin{matrix}{{\frac{1}{Z_{0}} + \frac{1}{Z_{1}}} = {\frac{1}{N}\frac{\lambda}{d^{2}}}} & (1)\end{matrix}$

A value N varies depending on the form of a phase grating, and is a realnumber that can be expressed as follows. It is noted that a value n is anatural number.

π phase grating in one-dimensional array: N=n/4−⅛

π/2 phase grating in one-dimensional array: N=n−½

π phase grating with checker board designed pattern in two-dimensionalarray: N=n/4−⅛

π/2 phase grating with checker board designed pattern in two dimensions:N=n/2−¼

(Absorption Grating)

The period of the interference intensity distribution is typicallysmaller than the pixel size of the X-ray detector 170. Hence, theinterference intensity distribution cannot be detected in this state.Therefore, the absorption grating 150 is used to generate a Moiré with aperiod that is larger than the pixel size of the X-ray detector 170, sothat the X-ray detector 170 detects the intensity distribution of theMoiré. The absorption grating 150 is desirably provided at a positionseparated from the phase grating 130 by the distance Z₁.

The absorption grating 150 includes transmissive portions 151 andlight-shielding portions 152 which are periodically arrayed and arrangedto partly shield bright sections of the interference intensitydistribution 140 formed by the phase grating 130. Each transmissiveportion 151 does not have to have an opening penetrating through theabsorption grating 150 as long as the transmissive portion 151 canpartly transmit the X-rays. The material of the absorption grating 150is not particularly limited as long as the material has high absorbencyfor the X-rays. The material may be, for example, gold.

The period of the absorption grating 150 is equivalent to or slightlydifferent from the period of the interference intensity distribution.

If the absorption grating with a period equivalent to the period of theinterference intensity distribution is used, a Moiré is generated byin-plane rotation of the absorption grating. When the period of theinterference intensity distribution is represented by D, and the angledefined between the orientation of bright and dark sections in theinterference intensity distribution and the orientation of theabsorption grating is represented by θ (here, θ<<1), the period Dm ofthe Moiré is D/θ.

In contrast, if the absorption grating with the period slightlydifferent from the period of the interference intensity distribution isused, a Moiré is generated without in-plane rotation of the absorptiongrating. When the period of the absorption grating is expressed byDa=D+δ (here, δ<<D), the period Dm of the Moiré is D²/δ.

In the absorption grating 150, the transmissive portions 151 may be one-or two-dimensionally arrayed.

For example, if a π phase grating with a checker board designed patternshown in FIG. 2A is used, an absorption grating 300 with alattice-shaped pattern, in which transmissive portions 351 andlight-shielding portions 352 are two-dimensionally arrayed as shown inFIG. 3A, is used. If a π/2 phase grating a checker board designedpattern shown in FIG. 2A is used, an absorption grating 300 with achecker board designed pattern, in which transmissive portions 351 andlight-shielding portions 352 are two-dimensionally arrayed as shown inFIG. 3B, is used.

The aforementioned combination of the phase grating and the absorptiongrating is merely an example, and various combinations may be made.

(Detector)

Information of the interference intensity distribution for the X-raystransmitted through the absorption grating 150 is detected as anintensity distribution of the Moiré by the X-ray detector 170. The X-raydetector 170 is an element that can detect the information of theinterference intensity distribution for the X-rays. For example, a flatpanel detector (FPD) capable of conversion into digital signals may beused.

(Arithmetic Unit)

The information of the intensity distribution of the Moiré detected bythe X-ray detector 170 is analyzed by an arithmetic unit 180 through ananalysis method, which will be described later, so as to image adifferential phase image or a phase image. The acquired differentialphase image or phase image is an output image to be displayed on adisplay unit 190. The arithmetic unit 180 includes, for example, acentral processing unit (CPU).

An analysis method for acquiring a phase image from the information ofthe intensity distribution of the Moiré acquired by the detector will bedescribed below. Then, a processing step executed by the arithmetic unitwill be described.

(Analysis Method)

When the interference intensity distribution is formed, many rays ofdiffracted light are superposed and interfere with each other. Hence,the interference intensity distribution contains a fundamental frequency(hereinafter, referred to as carrier frequency) and a large number ofharmonic components of the carrier frequency. A Moiré has a shape inwhich a carrier frequency component in the interference intensitydistribution is spatially spread. When the one-dimensional phase gratingwith a rule orthogonal to the x axis is used, the Moiré can be expressedby Expression (2).

g(x,y)=a(x,y)+b(x,y)cos(2πf ₀ x+φ(x,y))  (2)

In contrast, when the two-dimensional phase grating is used, a carrierfrequency component in the y direction is superposed on the result ofExpression (2).

In Expression (2), the Moiré is expressed by the sum of the backgroundfirst term and the periodic second term. Herein, a(x, y) indicates thebackground, and b(x, y) indicates the amplitude of the carrier frequencycomponent. Also, a value f₀ indicates the carrier frequency of aninterference fringe, and φ(x, y) indicates the phase of the carrierfrequency component.

When the π/2 phase grating with the checker board designed pattern isused as the phase grating 130, the carrier frequency component isgenerated because of interference between zeroth order diffracted lightand plus first order diffracted light, and interference between zerothorder diffracted light and minus first order diffracted light. When theπ phase grating with the checker board designed pattern is used as thephase grating 130, the carrier frequency component is generated due tointerference between plus first order diffracted light and minus firstorder diffracted light.

For the zeroth order diffracted light and the first order diffractedlight, rays separated from one another by a distance Nd are superposedon one another at the phase grating 130. For the plus first orderdiffracted light and the minus first order diffracted light, raysseparated from one another by a distance 2Nd are superposed on oneanother at the phase grating 130. That is, such interference is shearinginterference with a shear amount s corresponding to Nd in the case ofthe π/2 phase grating, or shearing interference with a shear amount scorresponding to 2Nd.

When the phase image of the subject 120 at the position of the phasegrating 130 is W(x, y), a phase φ(x, y) and a phase image W(x, y) havethe following relationship.

Φ(x,y)=W(x+s,y)−W(x,y)

The value s is typically very small. Thus, the following is obtained.

$\begin{matrix}{{\varphi \left( {x,y} \right)} \cong {s\frac{\partial}{\partial x}{W\left( {x,y} \right)}}} & (3)\end{matrix}$

Regarding Expression (3), it is found that the phase φ(x, y) isinformation acquired by differentiating the phase image W(x, y) of thesubject 120. Therefore, the phase image W(x, y) of the subject 120 canbe acquired by integrating φ(x, y).

Meanwhile, the phase φ(x, y) can be acquired from Expression (2) byFourier transform. That is, Expression (2) can be expressed as follows.

g(x,y)=a(x,y)+c(x,y)exp(2πif ₀ x)+c*(x,y)exp(−2πif ₀ x)  (4)

Herein, the following is obtained.

c(x,y)=½b(x,y)exp[iφ(x,y)]  (5)

Therefore, the information of the phase φ(x, y) can be acquired byextracting a component of c(x, y) or a component of c*(x, y) from theinterference fringe.

Herein, by the Fourier transform, Expression (4) is as follows.

G(f _(x) ,f _(y))=A(f _(x) ,f _(y))+C(f _(x) −f ₀ ,f _(y))+C*(f _(x) +f₀ ,f _(y))  (6)

Herein, G(f_(x), f_(y)), A(f_(x), f_(y)), and C(f_(x), f_(y)) aretwo-dimensional Fourier transform for g(x, y), a(x, y), and c(x, y).

FIG. 4 is a spectrum pattern of the interference intensity distributionwhen the one-dimensional grating is used. Typically, three peaks aregenerated as shown in FIG. 4. The center peak is a peak mainly resultedfrom A(f_(x), f_(y)). In contrast, peaks on both sides are carrierfrequency peaks resulted from C(f_(x), f_(y)) and C*(f_(x), f_(y)).These peaks are generated at positions of ±f₀.

Next, a region containing the peak resulted from C(f_(x), f_(y)) orC*(f_(x), f_(y)) is extracted. For example, by extracting the peripheryof the peak resulted from A(f_(x), f_(y)) and the periphery of the peakresulted from C(f_(x), f_(y)) or C*(f_(x), f_(y)), the peak resultedfrom C(f_(x), f_(y)) or C*(f_(x), f_(y)) is separated.

Next, the separated peak resulted from C(f_(x), f_(y)) or C*(f_(x),f_(y)) is moved to an origin in a frequency space, and inverse Fouriertransform is performed. By inverse Fourier transform, complex numberinformation is acquired. With the complex number information, the phaseφ(x, y), that is, differential phase information is acquired.

FIG. 5A is an example of an intensity distribution of a Moiré when theπ/2 phase grating with the checker board designed pattern (FIG. 2A) andthe absorption grating with the lattice-shaped pattern (FIG. 3A) or theabsorption grating with the checker board designed pattern (FIG. 3B) areused. Reference sign 510 denotes bright sections of the Moiré, and 520denotes dark sections of the Moiré. It is to be noted that the intensitydistribution of the Moiré is generated in an oblique direction even whenthe π phase grating with the checker board designed pattern (FIG. 2A)and the absorption grating with the checker board designed pattern (FIG.3B) are used.

FIG. 5B is an example of an intensity distribution of a Moiré when the πphase grating with the checker board designed pattern (FIG. 2A) and theabsorption grating with the lattice-shaped pattern (FIG. 3A) are used.Reference sign 530 denotes bright sections of the Moiré, and 540 denotesdark sections of the Moiré. In this case, the intensity distribution ofthe Moiré is generated in vertical and horizontal directions.

It is to be noted that the intensity distribution of the Moiré isgenerated even when the phase grating with the lattice-shaped pattern(FIG. 2B) is used.

FIGS. 5C and 5D illustrate spatial frequency spectra acquired byperforming processing for the intensity distributions of the Moiré shownin FIGS. 5A and 5B by fast Fourier transform (FFT) which is a kind ofFourier transform. The maximum spatial frequency that can be calculatedby FFT is 1/(2P) when P is a pixel period of the X-ray detector 170.

The peripheries of two peaks 570 and 571 and peaks 580 and 581,respectively at positions orthogonal to one another, are extracted in asimilar manner to the one-dimensional configuration, and are moved tothe origin to perform inverse Fourier transform. The extracted regionsare indicated by broken lines. By inverse Fourier transform, complexnumber information is acquired. With the complex number information,differential phase information in the two directions orthogonal to oneanother is acquired.

Herein, in FIG. 5C, differential phase information in directions at ±45degrees is acquired. In FIG. 5D, differential phase information in X andY directions is acquired.

In many cases, the differential phase information thus acquired isfolded into (wrapped into) a region of 2π. In particular, when a truephase at any point on a screen is φ(x, y) and a wrapped phase isφ_(wrap)(x, y), the following relationship is established.

φ_(wrap)(x,y)=φ(x,y)+2πn(x,y)  (7)

where n is an integer which is determined so that φ_(wrap)(x, y) isarranged in a region with a width of 2π, for example, a region from 0 to2π, or a region from −π to +π.

With such information, phase unwrapping is performed for φ_(wrap)(x, y)to retrieve the value to the original φ(x, y).

The phase image W(x, y) of the subject can be acquired by integratingφ(x, y) retrieved by Expression (8).

$\begin{matrix}{{W\left( {x,y} \right)} = {\frac{1}{s}{\int{{\varphi \left( {x,y} \right)}{x}}}}} & (8)\end{matrix}$

When the one-dimensional grating is used, the integration direction canbe only the direction orthogonal to the grating rule direction. Owing tothis, to correctly measure the phase image W(x, y), a side of the X-raydetector 170 parallel to the rule direction is irradiated with X-raysthat are not transmitted through the subject 120 so that a recognizedportion in the phase image W(x, y) is acquired in advance.

When the two-dimensional grating is used, integration can be performedin two directions. The phase image W(x, y) can be correctly measuredeven if the X-ray detector 170 is entirely irradiated with the X-raystransmitted through the subject 120.

(Processing Step by Arithmetic Unit)

With regard to the above description, an example of a processing flowexecuted by the arithmetic unit 180 will be illustrated in FIG. 6.

First, the information of the intensity distribution of the Moiré isacquired from the X-ray detector 170 (S610).

Next, a Fourier transform step is performed (S620) such that Fouriertransform is performed for the information of the intensity distributionof the Moiré acquired in S610 and the spatial frequency spectrum isacquired.

Next, a peak separating step is performed (S631) such that the spectrumcorresponding to the carrier frequency (spectrum having phaseinformation) is extracted from the frequency space acquired in S620. Ifit is difficult to extract the spectrum corresponding to the carrierfrequency, information of a peripheral region of the spectrum isextracted.

Next, the spectrum extracted in S631 is moved to the origin in thefrequency space, and inverse Fourier transform is performed (S632).Accordingly, complex number information having phase information can beacquired.

Next, the phase φ(x, y) as differential phase information is acquiredfrom the complex number information acquired in S632 (S633). It is to benoted that the steps S631, S632, and S633 may be collectively calledphase retrieval step (S630).

Next, when φ(x, y) is being wrapped, unwrapping is performed, and thetrue φ(x, y) is acquired (S640). The step may be called phase unwrappingstep. If φ(x, y) is not wrapped, the step S640 may be omitted. Herein,φ(x, y) is differential phase information (differential phase image).

Next, by integrating φ(x, y), the phase image W(x, y) is acquired(S650).

With the above configuration, the X-ray imaging apparatus and the X-rayimaging method that can acquire a phase image of a subject by at least asingle imaging operation can be provided. In addition, a program thatcauses a computer to execute the above steps can be provided.

Second Embodiment

An X-ray imaging apparatus according to a second embodiment of thepresent invention will be described with reference to FIGS. 7A and 7B.In this embodiment, a spatial resolution is increased rather than thespatial frequency spectrum described in the first embodiment and shownin FIG. 5C.

FIG. 7B illustrates a spatial frequency spectrum which is described inthis embodiment. To acquire such a frequency spectrum, a fundamentalperiod of a two-dimensional Moiré resulted from an interferenceintensity distribution and an absorption grating is determined withrespect to a pixel period of the X-ray detector to achieve the followingratio.

2√{right arrow over (2)} times

Also, the orientation of the Moiré is adjusted to be inclined at 45degrees to the pixel array.

FIG. 7A illustrates the intensity distribution of the Moiré on the X-raydetector in this state. Reference sign 710 denotes a light-receivingsurface of the X-ray detector, 720 denotes bright sections of the Moiré,d denotes a period of the Moiré, and P denotes a pixel period of theX-ray detector. In this embodiment, the π/2 phase grating with thechecker board designed pattern (FIG. 2A) and the absorption grating withthe checker board designed pattern (FIG. 3B) are used. However, otherphase grating and other absorption grating may be used as long as theintensity distribution of the Moiré to be generated is equivalent.

FIG. 7B is a spatial frequency spectrum acquired by performing FFT forthe intensity distribution of the Moiré shown in FIG. 7A. When thenumber of pixels in the array is n for each of the vertical andhorizontal sides, the spectrum space acquired by FFT is discrete data ofn×n. The maximum frequency that can be expressed is 1/(2P) when P is apixel period of the X-ray detector 170.

In this embodiment, the fundamental period of the Moiré is as follows.

2√{right arrow over (2)} P

Thus, the absolute value of the carrier frequency with that frequency isas follows.

1/(2√{right arrow over (2)} P)

Also, since the orientation of the Moiré is inclined at 45 degrees, acarrier peak 711 is generated at the following position.

${{Frequency}\mspace{14mu} {{coordinates}\left( {{fx},{fy}} \right)}} = \left( {{\pm \frac{1}{4P}},{\pm \frac{1}{4P}}} \right)$

The carrier peak 711 is a peak corresponding to the carrier frequency ofthe intensity distribution of the Moiré.

Two adjacent peaks included in four carrier peaks 711 are extracted inthe form of a square region inclined at 45 degrees, the square regioneach having a side expressed as follows.

1/(2√{right arrow over (2)} P)

After the square region is extracted, the processing described in thefirst embodiment is performed. Accordingly, the phase image of thesubject can be retrieved.

If the spectrum region is extracted by a large area as possible, thespatial resolution can be increased. However, in addition to the peak ofthe carrier frequency, an unnecessary peak 721 is present in thespectrum space. The unnecessary peak 721 is a peak of a high-frequencycomponent and a DC component and located at a position corresponding tothe sum or difference of peak coordinates of carrier frequencycomponents.

If the extraction region is too large, the region around the unnecessarypeak 721 may be included. A correct phase image is no longer provideddue to the effect of the unnecessary peak 721. Accordingly, the spectrumregion to be extracted is an extraction region 731 located at the innerside with respect to the intermediate line between the peak of thecarrier frequency and the unnecessary peak 721.

The spatial frequency of the phase image to be retrieved in thisembodiment is ½ of the size of the extraction region 731. Thus, as it isfound in FIG. 7B, the maximum frequency in the pixel array direction is1/(4P), and the maximum frequency in the direction at 45 degrees isdetermined as follows.

1/(4√{right arrow over (2)} P)

To express the minimum period on a pixel basis, which can be retrievedwith the value as the resolution, the minimum period is the reciprocalof the maximum frequency. Thus, the minimum period in the pixel arraydirection is 4 pixels, and the minimum period in the direction at 45degrees is as follows:

4√{right arrow over (2)} pixels≈5.7 pixels

Comparing with the extraction region in FIG. 5C, the extraction regionin FIG. 7B is larger than the extraction region in FIG. 5C, and hence,the spatial frequency that can be retrieved is larger. Thus, with thisembodiment, the spatial frequency can be increased as compared with theaforementioned embodiment.

Third Embodiment

An X-ray imaging apparatus according to a third embodiment of thepresent invention will be described with reference to FIGS. 8A and 8B.In this embodiment, the spatial resolution is increased rather than thespatial frequency spectrum described in the first embodiment and shownin FIG. 5D.

FIG. 8B illustrates a spatial frequency spectrum which is described inthis embodiment. To acquire such a frequency spectrum, a fundamentalperiod of a two-dimensional Moiré resulted from an interferenceintensity distribution and an absorption grating is determined to bethree times a pixel period of the X-ray detector, and the orientation ofthe Moiré is aligned with the pixel array.

FIG. 8A illustrates the intensity distribution of the Moiré on the X-raydetector in this state. Reference sign 810 denotes a light-receivingsurface of the X-ray detector, 820 denotes bright sections of the Moiré,d denotes a period of the Moiré, and P denotes a pixel period of theX-ray detector. In this embodiment, the π phase grating with the checkerboard designed pattern (FIG. 2A) and the absorption grating with thelattice-shaped pattern (FIG. 3A) are used. However, other phase gratingand other absorption grating may be used as long as the intensitydistribution of the Moiré to be generated is equivalent.

FIG. 8A is a spatial frequency spectrum acquired by performing FFT forthe intensity distribution of the Moiré shown in FIG. 8B. Since thefundamental period of the Moiré is 3P in this embodiment, the absolutevalue of the carrier frequency is 1/(3P). Thus, a carrier peak 811 isgenerated at the following position.

${{Frequency}\mspace{14mu} {{coordinates}\left( {{fx},{fy}} \right)}} = {\left( {{\pm \frac{1}{3P}},0} \right)\mspace{14mu} {or}\mspace{14mu} \left( {0,{\pm \frac{1}{3P}}} \right)}$

The carrier peak 811 is a peak corresponding to the carrier frequency ofthe intensity distribution of the Moiré. Similar to the secondembodiment, erecting square regions each having a side of 1/(3P) areextracted for two adjacent peaks included in four carrier peaks 811.After the square regions are extracted, the processing described in thefirst embodiment is performed. Accordingly, the phase image of thesubject can be retrieved.

However, in this embodiment, in addition to the peak of the carrierfrequency, an unnecessary peak 821 is present in the spectrum space. Theunnecessary peak 821 is a peak of a high-frequency component and a DCcomponent and located at a position corresponding to the sum ordifference of peak coordinates of carrier frequency components.Accordingly, the spectrum region to be extracted is an extraction region831 located at the inner side with respect to the intermediate linebetween the peak of the carrier frequency and the unnecessary peak 821.

The spatial frequency of the phase image to be retrieved in thisembodiment is ½ of the size of the extraction region 831. Thus,referring to FIG. 8B, the maximum frequency in the pixel array directionis 1/(6P), and the maximum frequency in the direction at 45 degrees isdetermined as follows.

1/(3√{right arrow over (2)} P)

To express the minimum period on a pixel basis retrieved with the abovevalue as the resolution, the minimum period is the reciprocal of themaximum frequency. Thus, the minimum period in the pixel array directionis 6 pixels, and the minimum period in the direction at 45 degrees is asfollows.

3√{right arrow over (2)} pixels≈4.2 pixels

Therefore, the spatial resolution in the direction at 45 degrees withrespect to the pixel array in this embodiment is better than the secondembodiment.

Fourth Embodiment

An X-ray imaging apparatus according to a fourth embodiment of thepresent invention will be described with reference to FIG. 9. The X-rayimaging apparatus of this embodiment is the X-ray imaging apparatusaccording to any one of the first to third embodiments including asubject moving device 900. The subject moving device 900 can move asubject 920 along the optical axis of X-rays.

The X-ray detector has a magnification of imaging for the subject 920 ofL1/L2 where L1 is a distance from an X-ray source 910 to an absorptiongrating 940, and L2 is a distance from the X-ray source 910 to thesubject 920.

Thus, as the subject 920 is moved closer to a phase grating 930, L2becomes larger, and imaging can be performed with a low magnification.In contrast, as the subject 920 is moved closer to the X-ray source 910,L2 becomes smaller, and imaging can be performed with a highmagnification.

With the present invention, the X-ray imaging apparatus and the X-rayimaging method that can acquire a differential phase image or a phaseimage of a subject by at least a single imaging operation can beprovided.

While the present invention has been described with reference toexemplary embodiments, it is to be understood that the invention is notlimited to the disclosed exemplary embodiments. The scope of thefollowing claims is to be accorded the broadest interpretation so as toencompass all such modifications and equivalent structures andfunctions.

REFERENCE SIGNS LIST

-   -   110 X-ray source    -   111 X-ray    -   120 subject    -   130 phase grating    -   150 absorption grating    -   151 transmissive portion    -   152 light-shielding portion    -   170 X-ray detector    -   180 arithmetic unit

1. An X-ray imaging apparatus for imaging a subject comprising: adiffraction grating that forms an interference intensity distribution bydiffracting an X-ray from an X-ray source; a shielding grating thatforms Moiré by partly shielding the X-ray from the diffraction grating;a detector that detects information of an intensity distribution of theMoiré by detecting the X-ray from the shielding grating; and acalculator that obtains information of a differential phase image of thesubject by performing Fourier transform for the information of theintensity distribution of the Moiré detected by the detector.
 2. TheX-ray imaging apparatus according to claim 1, wherein the diffractiongrating forms an interference intensity distribution in which bright anddark sections are arranged two-dimensionally, wherein the shieldinggrating forms Moiré having a two-dimensional period by shielding a partof the X-ray form the diffraction grating, and wherein the calculatorobtains information of a differential phase image of the subject in afirst direction and information of a differential phase image of thesubject in a second direction intersecting with the first direction, byperforming Fourier transform for the information of the intensitydistribution of the Moiré having the two-dimensional period.
 3. TheX-ray imaging apparatus according to claim 2, wherein the diffractiongrating is a phase grating, wherein the phase grating has phase advanceportions and phase lag portions that are two-dimensionally arranged, andwherein the shielding grating has X-ray shielding portions and X-raytransmitting portions that are two-dimensionally arranged.
 4. The X-rayimaging apparatus according to claim 2, wherein the first direction andthe second direction are orthogonal to each other.
 5. The X-ray imagingapparatus according to claim 1, wherein the calculator obtains the phaseimage of the subject by integrating the information of the differentialphase image of the subject.
 6. The X-ray imaging apparatus according toclaim 1, wherein the calculator is configured to execute a step ofobtaining a spatial frequency spectrum by performing Fourier transformfor the information of the intensity distribution of the Moiré and astep of extracting spectrum corresponding to a carrier frequency fromthe spatial frequency spectrum and obtaining the information of thedifferential phase image of the subject by performing inverse Fouriertransform of the spectrum corresponding to the carrier frequency.
 7. TheX-ray imaging apparatus according to claim 1, wherein the subject isplaced between the X-ray source and the diffraction grating, or betweenthe diffraction grating and the shielding grating.
 8. An imaging methodused in an imaging apparatus for imaging a subject, the imaging methodcomprising: forming an interference intensity distribution bydiffracting an X-ray; forming Moiré by partly shielding the X-ray thatforms the interference intensity distribution; detecting information ofan intensity distribution of the Moiré by detecting the X-ray; andobtaining information of a differential phase image of the subject byperforming Fourier transform for the information of the intensitydistribution of the Moiré.
 9. A non-transitory computer-readable mediumstoring thereon a program that when executed on a computer causes anX-ray imaging apparatus to execute a process comprising: forming aninterference intensity distribution by diffracting an X-ray; formingMoiré by partly shielding the X-ray that forms the interferenceintensity distribution; detecting information of an intensitydistribution of the Moiré by detecting the X-ray; and obtaininginformation of a differential phase image of the subject by performingFourier transform for the information of the intensity distribution ofthe Moiré.